File:Retention and endurance characteristics.png

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English: a) Retention data for a 20 µm gate-length cell. b) S-D current difference (∆IS-D) for the >24 h retention plotted on a log scale. c) Endurance data for continuous program-read-erase-read cycling (5 ms pulses) on a second 20 µm gate-length cell d) Extended endurance to >107 cycles. e) Oscilloscope trace
Date
Source ULTRARAM: A Low-Energy, High-Endurance, Compound-Semiconductor Memory on Silicon
Author Peter D. Hodgson,Dominic Lane,Peter J. Carrington,Evangelia Delli,Richard Beanland,Manus Hayne

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8 April 2022

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current07:56, 8 April 2022Thumbnail for version as of 07:56, 8 April 2022653 × 623 (214 KB)Avast rumaliUploaded while editing "User:Avast_rumali/sandbox" on en.wikipedia.org
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