File:Kelvin probe force microscopy.svg
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Summary
| Description | In Kelvin probe force microscopy, a conducting cantilever is scanned over a surface at a constant height while an AC+DC potential is applied. The AC signal is a sinusoid whose frequency matches the mechanical resonance of the cantilever. The cantilever is driven into oscillation by electrostatic forces where the DC potential difference between the surface and the cantilever is non-zero. Using a four-quadrant detector and an A/D to detect cantilever motion, the feedback circuit drives the DC signal to the surface potential, minimizing cantilever motion and resulting in a map of the work function of the surface. |
| Date | March 1, 2008 (UTC+0100) |
| Source | Own work |
| Author | Inkwina (talk · contribs) |
| Other versions |
Derivative works of this file: Kelvin probe force microscopy DE.svg Image:Kpfm.png |
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Credit
Based on Image:Kpfm.png drawn by Alison Chaiken using the xfig program. Originally uploaded as w:Kpfm.png.
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Permission is granted to copy, distribute and/or modify this document under the terms of the GNU Free Documentation License, Version 1.2 or any later version published by the Free Software Foundation; with no Invariant Sections, no Front-Cover Texts, and no Back-Cover Texts. A copy of the license is included in the section entitled GNU Free Documentation License. |
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 16:53, 1 March 2008 | | 860 × 470 (83 KB) | Inkwina | Fixed SVG |
| 16:21, 1 March 2008 |  | 860 × 470 (84 KB) | Inkwina | {{Information |Description=In Kelvin probe force microscopy, a conducting cantilever is scanned over a surface at a constant height while an AC+DC potential is applied. The AC signal is a sinu |
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